Louai Zaiter

Zaiter, L & Zwiggelaar, R 2024, Segmentation and Classification of Mammographic Abnormalities using Local Binary Patterns and Deep Learning. in ML Giger, HM Whitney, K Drukker & H Li (eds), 17th International Workshop on Breast Imaging, IWBI 2024., 131741Z, Proceedings of SPIE - The International Society for Optical Engineering, vol. 13174, SPIE, 17th International Workshop on Breast Imaging, IWBI 2024, Chicago, United States of America, 09 Jun 2024. 10.1117/12.3026886